SEMICONDUCTOR INTEGRATED CIRCUIT APPARATUS

PROBLEM TO BE SOLVED: To prevent excessive erasing of memory cells and to reduce largely deterioration and disturbance of memory cells, in multi-bank erasing. SOLUTION: In multi-bank erasing operation of a nonvolatile semiconductor memory, a verify pass signal VP of a Hi level is output from a bank...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: MATSUSHITA TORU, MUKODA HIDEFUMI, OTA TAKESHI
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!