SYSTEM AND METHOD FOR ALIGNING FEATURE PART

PROBLEM TO BE SOLVED: To provide a chromatography system and a method capable of accurately comparing feature parts such as retention times etc. and reducing the possibility of mismatching between feature parts and incorrect correlation. SOLUTION: The chromatography system and the method for alignin...

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1. Verfasser: LI XIANGDONG DON
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a chromatography system and a method capable of accurately comparing feature parts such as retention times etc. and reducing the possibility of mismatching between feature parts and incorrect correlation. SOLUTION: The chromatography system and the method for aligning feature parts are provided. The system determines a first feature part set on the passage of a first sample by passing the first sample through a first separation column. The system also detects a second feature part set on the passage of a second sample by passing the second sample through a second separation column. Then the system evaluates systematic deviations of feature parts between the passage of the first sample through the first separation column and the passage of the second sample through the second separation column. The system adjusts the second feature part set detected on the passage of the second sample through the second separation column on the basis of evaluated systematic deviations to acquire an adjusted third feature part set. COPYRIGHT: (C)2007,JPO&INPIT