CIRCUIT SWITCHING DEVICE FOR CT PRIMARY TEST AND ITS SWITCHING METHOD

PROBLEM TO BE SOLVED: To provide a circuit switching device for a CT primary test and its switching method that shortens a working time for the CT primary test and prevent an electric shock to a worker. SOLUTION: The circuit switching device for the CT primary test (10) is provided with a plurality...

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Hauptverfasser: SHIODA FUTAO, KAGEYOSHI HIROSHI, FUKUDA TAKESHI, AKIOKA MASAHIRO, HATAYAMA KUNIYOSHI
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a circuit switching device for a CT primary test and its switching method that shortens a working time for the CT primary test and prevent an electric shock to a worker. SOLUTION: The circuit switching device for the CT primary test (10) is provided with a plurality of switches (21, 22, 32, 33 and 34) that are opened and closed in such a way that test currents inputted from a test circuit into a test current input terminal (11) are outputted from predetermined output terminals of first to third output terminals (51, 52 and 53), the test currents that return from a current transformer (CT) are inputted into predetermined input terminals of first to third input terminals (61, 62 and 63), and these test currents are outputted from a test current output terminal (12) to the test circuit. COPYRIGHT: (C)2007,JPO&INPIT