EMISSION SPECTROPHOTOMETRY AND EMISSION SPECTROPHOTOMETER

PROBLEM TO BE SOLVED: To solve a problem wherein a used measuring wavelength is switched only in a prescribed concentration, and a problem wherein measurement is thereby carried out, as it is, without using other proper measuring wavelength, even when spectral interference is generated in the measur...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: NISHI NOBUHIKO, OMORI YOSHIHISA
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To solve a problem wherein a used measuring wavelength is switched only in a prescribed concentration, and a problem wherein measurement is thereby carried out, as it is, without using other proper measuring wavelength, even when spectral interference is generated in the measuring wavelength by a coexisting element, in an emission spectrophotometer set with the plurality of measuring wavelengths for the purpose of securing a wide dynamic range. SOLUTION: In this emission spectrophotometry, measuring precision based on the interference of the coexisting element in response to an objective element is calculated as to each of the measuring wavelengths, a post-interference concentration measuring area based on the interference of the coexisting element is determined based on the calculated measuring precision, as the each measuring wavelength. and a quantitative analytical value by the measuring wavelength having the highest calculated measuring precision is selected out of the wavelengths with the concentration of the objective element included within the post-interference concentration measuring area. The measurement is finished at one time by the quantitative analytical method, because the optimum measuring wavelength is automatically selected. COPYRIGHT: (C)2007,JPO&INPIT