ESTIMATION METHOD OF LAYER STRUCTURE, AND ANALYSIS DEVICE FOR ANALYZING LAYER STRUCTURE

ESTIMATION METHOD OF LAYER STRUCTURE, AND ANALYSIS DEVICE FOR ANALYZING LAYER STRUCTURE

PROBLEM TO BE SOLVED: To improve the accuracy of solution by reverse analysis, and to estimate a layer structure with a high accuracy. SOLUTION: In the estimation method of the layer structure, the horizontal/vertical spectrum ratio is calculated based on observation data of the horizontal component...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: UETAKE TOMIICHI, HIJIKATA KATSUICHIRO, KOBAYASHI KIKUJI
Format: Patent
Sprache:eng
Schlagworte:
DETECTING MASSES OR OBJECTS
EMBANKMENTS
EXCAVATIONS
FIXED CONSTRUCTIONS
FOUNDATIONS
GEOPHYSICS
GRAVITATIONAL MEASUREMENTS
HYDRAULIC ENGINEERING
MEASURING
PHYSICS
SOIL SHIFTING
TESTING
UNDERGROUND OR UNDERWATER STRUCTURES
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To improve the accuracy of solution by reverse analysis, and to estimate a layer structure with a high accuracy. SOLUTION: In the estimation method of the layer structure, the horizontal/vertical spectrum ratio is calculated based on observation data of the horizontal component and vertical component at an earthquake observation point. Then, target data based on the absolute value of the horizontal/vertical spectrum ratio and the phase is set. The layer structure at the earthquake observation point is set as an unknown quantity, the unknown quantity is determined by the reverse analysis based on the target data, and the layer structure at the earthquake observation point is estimated. COPYRIGHT: (C)2007,JPO&INPIT