METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

PROBLEM TO BE SOLVED: To provide a method for inhibiting excessive etching in the vicinity of a gate electrode. SOLUTION: An amorphous carbon layer 46 is formed on a substrate on which layers 43 and 44 to be etched are formed. A resist pattern 47 patterned in a predetermined region is formed on the...

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Bibliographische Detailangaben
Hauptverfasser: KOBAYASHI MASAHARU, YAO TERUYOSHI, HASHIMOTO KOICHI, NAORI NOBUHISA, OSHIMA MASASHI, KAWAMURA EIICHI
Format: Patent
Sprache:eng
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