SEMICONDUCTOR DEVICE AND CIRCUIT TESTING METHOD OF SEMICONDUCTOR DEVICE

PROBLEM TO BE SOLVED: To shorten a test time by enabling discrimination of an abnormal circuit in simple configuration and reducing the number of current measuring points when performing direct current leak test by dividing the semiconductor device into a plurality of circuit blocks. SOLUTION: A plu...

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Hauptverfasser:	SONE TAKAHIRO, KOSHIBA HIROKAZU, YAMAMOTO KENTARO, GOMYO HIROYUKI, TANAKA YOSHIYUKI, TSUSAKA ISAMU, YAMAGUCHI NORIYUKI, IMADA RYOICHI, IWASAKI TAKEHIKO, OKAWA TSUTOMU
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To shorten a test time by enabling discrimination of an abnormal circuit in simple configuration and reducing the number of current measuring points when performing direct current leak test by dividing the semiconductor device into a plurality of circuit blocks. SOLUTION: A plurality of mutually separated power source voltage supply sources 105 and 106 and a plurality of mutually separated earths 107 and 108 are connected so that the combination of the power source voltage supply sources 105 and 106 and the earths 107 and 108 to each of circuit blocks 101-104 divided into two or more is the one. Current values 109-112 flowing in each of the power source voltage supply sources 105 and 106 and the earths 107 and 108 are measured, and the circuit block in which abnormality occurs is specified by the combination of the power source voltage supply sources 105 and 106 and the earths 107 and 108 in which the current value is abnormal. COPYRIGHT: (C)2007,JPO&INPIT