FILM THICKNESS IRREGULARITY DETECTION METHOD

PROBLEM TO BE SOLVED: To provide a method for efficiently detecting the coating irregularity of a transparent photosensitive resin film applied to a large-area base. SOLUTION: Irradiation light X is applied to the surface of the base 1 obliquely, a convex lens 2 is arranged on the optical path of re...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HANEHIRO KENICHI, MIHASHI MITSUSACHI
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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