MOVING VELOCITY MEASURING DEVICE OF HIGH TEMPERATURE METAL MATERIAL

PROBLEM TO BE SOLVED: To provide a moving velocity measuring device which is capable of accurately measuring the moving velocity of a high temperature metal material by non-contact and superior in maintainability. SOLUTION: The moving velocity measuring device 10 of this invention comprises an imagi...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: YADOGUCHI TETSUYA, ANDO TAKASHI, SAZUKA HIROSHI, KAWAMURA TADAYASU
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide a moving velocity measuring device which is capable of accurately measuring the moving velocity of a high temperature metal material by non-contact and superior in maintainability. SOLUTION: The moving velocity measuring device 10 of this invention comprises an imaging device 1 photographing the surface of the moving high temperature metal material S and an image processor 2 for processing the image photographed with the imaging device and calculating the moving velocity of the high temperature metal material. The image processor extracts a specific pixel region corresponding to the region which is a region excluding the near edge part E of the high temperature metal material and where scale exists, for the first image photographed with the photographing device, as sensing object and registers it. The image processor also excludes a pixel region having relativity with the registered sensing object for the second image photographed with the photographing device after elapse of a certain time. By dividing the parting distance of each pixel region extracted from each of the first image and the second image by the specific time, the moving velocity of the high temperature metal material is calculated. COPYRIGHT: (C)2006,JPO&NCIPI