SYSTEM AND METHOD FOR CALIBRATING WEAK WRITE TEST MODE(WWTM)

SYSTEM AND METHOD FOR CALIBRATING WEAK WRITE TEST MODE(WWTM)

PROBLEM TO BE SOLVED: To provide an improved method to adjust or calibrate the set value of a weak write test mode (WWTM). SOLUTION: According to at least one embodiment, a method comprises measuring (401) drive current of a reference memory cell (110) of a circuit (101), and determining (402), base...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: WUU JOHN J, WEISS DONALD R, WOODRUFF RICHARD L
Format: Patent
Sprache:eng
Schlagworte:
INFORMATION STORAGE
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
STATIC STORES
TESTING
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide an improved method to adjust or calibrate the set value of a weak write test mode (WWTM). SOLUTION: According to at least one embodiment, a method comprises measuring (401) drive current of a reference memory cell (110) of a circuit (101), and determining (402), based on the measured drive current of the reference memory cell, a drive current to be supplied to a calibration memory cell (120) of the circuit to mimic a defective memory cell. The method further comprises supplying the determined drive current to the calibration memory cell, and using the calibration memory cell to determine(403) strength of a weak write to be utilized by a weak write test for detecting defective RAM cells. COPYRIGHT: (C)2006,JPO&NCIPI