FLAW DETECTION PROBE AND FLAW DETECTOR

PROBLEM TO BE SOLVED: To provide a flaw detection probe and a flaw detector capable of estimating easily a depth of a flaw based on an output, without worsening detection precision of a flaw. SOLUTION: A conductor is wound in an angled barrel shape having a polygon of cross section perpendicular to...

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Bibliographische Detailangaben

1. Verfasser:	HIROSHIMA TATSUO
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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