FLAW DETECTION PROBE AND FLAW DETECTOR

PROBLEM TO BE SOLVED: To provide a flaw detection probe and a flaw detector capable of estimating easily a depth of a flaw based on an output, without worsening detection precision of a flaw. SOLUTION: A conductor is wound in an angled barrel shape having a polygon of cross section perpendicular to...

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1. Verfasser: HIROSHIMA TATSUO
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a flaw detection probe and a flaw detector capable of estimating easily a depth of a flaw based on an output, without worsening detection precision of a flaw. SOLUTION: A conductor is wound in an angled barrel shape having a polygon of cross section perpendicular to the center axis to form an excitation coil 11, and an annular detection coil 12 is arranged to surround one side face of the angled barrel shape of excitation coil 11 so as to constitute the flaw detection probe 1. The one side face of the excitation coil 11 surrounded by the detection coil 12 is made to serve as the flaw detection probe 1. A portion with a parallel component getting maximum with respect to a surface of a flaw detection object in a magnetic field generated by the excitation coil 11, and a portion with a perpendicular component getting maximum therewith are positioned together in an inside of the detection coil 12 to obtain a simple increase relation between the depth of the flaw and the output from the flaw detection probe 1. The depth of the flaw is easily estimated based on the output from the flaw detection probe 1, without worsening the detection precision of the flaw, because an S/N ratio is enhanced compared with that in the case where a diameter of the detection coil 12 is small. COPYRIGHT: (C)2006,JPO&NCIPI