POLISHING SOLUTION FOR METAL, AND POLISHING METHOD

PROBLEM TO BE SOLVED: To provide a metal polishing solution with a high metal polishing rate and high productivity which is suitable for a semiconductor device and apparatus which are excellent in fining, thin film processing, dimensional accuracy, electrical characteristics and reliability, and a p...

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Bibliographische Detailangaben
Hauptverfasser: SAKURADA TAKASHI, SHINODA TAKASHI, ANZAI SO, OMORI YOSHIKAZU
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide a metal polishing solution with a high metal polishing rate and high productivity which is suitable for a semiconductor device and apparatus which are excellent in fining, thin film processing, dimensional accuracy, electrical characteristics and reliability, and a polishing method using it. SOLUTION: The metal polishing solution comprises an abrasive grain and its characteristic after defrosting is not practically different than before freezing. In the polishing method, a polishing film is polished by relatively moving a polishing board and a substrate by pressing the substrate having the polishing film to a polishing cloth while supplying the metal polishing solution on the polishing cloth of the polishing board. COPYRIGHT: (C)2006,JPO&NCIPI