IC HANDLER APPARATUS

IC HANDLER APPARATUS

PROBLEM TO BE SOLVED: To provide an IC handler apparatus capable of inspecting an IC device of high temperature characteristics precisely at low cost. SOLUTION: The IC handler apparatus is characteristically provided with a hot air blowing means for blowing against the IC device with the hot air, a...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: KAWAMURA SHINICHIRO
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator KAWAMURA SHINICHIRO
description PROBLEM TO BE SOLVED: To provide an IC handler apparatus capable of inspecting an IC device of high temperature characteristics precisely at low cost. SOLUTION: The IC handler apparatus is characteristically provided with a hot air blowing means for blowing against the IC device with the hot air, a device guide for moving and setting the IC on a socket and at least one ventilation part provided on the device guide so as to blow against the IC device with the hot air from the hot air blowing means. COPYRIGHT: (C)2006,JPO&NCIPI
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2006112793A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2006112793A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2006112793A3</originalsourceid><addsrcrecordid>eNrjZBDxdFbwcPRz8XENUnAMCHAMcgwJDeZhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfFeAUYGBmaGhkbmlsaOxkQpAgClNB7o</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>IC HANDLER APPARATUS</title><source>esp@cenet</source><creator>KAWAMURA SHINICHIRO</creator><creatorcontrib>KAWAMURA SHINICHIRO</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide an IC handler apparatus capable of inspecting an IC device of high temperature characteristics precisely at low cost. SOLUTION: The IC handler apparatus is characteristically provided with a hot air blowing means for blowing against the IC device with the hot air, a device guide for moving and setting the IC on a socket and at least one ventilation part provided on the device guide so as to blow against the IC device with the hot air from the hot air blowing means. COPYRIGHT: (C)2006,JPO&amp;NCIPI</description><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20060427&amp;DB=EPODOC&amp;CC=JP&amp;NR=2006112793A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20060427&amp;DB=EPODOC&amp;CC=JP&amp;NR=2006112793A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KAWAMURA SHINICHIRO</creatorcontrib><title>IC HANDLER APPARATUS</title><description>PROBLEM TO BE SOLVED: To provide an IC handler apparatus capable of inspecting an IC device of high temperature characteristics precisely at low cost. SOLUTION: The IC handler apparatus is characteristically provided with a hot air blowing means for blowing against the IC device with the hot air, a device guide for moving and setting the IC on a socket and at least one ventilation part provided on the device guide so as to blow against the IC device with the hot air from the hot air blowing means. COPYRIGHT: (C)2006,JPO&amp;NCIPI</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBDxdFbwcPRz8XENUnAMCHAMcgwJDeZhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfFeAUYGBmaGhkbmlsaOxkQpAgClNB7o</recordid><startdate>20060427</startdate><enddate>20060427</enddate><creator>KAWAMURA SHINICHIRO</creator><scope>EVB</scope></search><sort><creationdate>20060427</creationdate><title>IC HANDLER APPARATUS</title><author>KAWAMURA SHINICHIRO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2006112793A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2006</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KAWAMURA SHINICHIRO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KAWAMURA SHINICHIRO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>IC HANDLER APPARATUS</title><date>2006-04-27</date><risdate>2006</risdate><abstract>PROBLEM TO BE SOLVED: To provide an IC handler apparatus capable of inspecting an IC device of high temperature characteristics precisely at low cost. SOLUTION: The IC handler apparatus is characteristically provided with a hot air blowing means for blowing against the IC device with the hot air, a device guide for moving and setting the IC on a socket and at least one ventilation part provided on the device guide so as to blow against the IC device with the hot air from the hot air blowing means. COPYRIGHT: (C)2006,JPO&amp;NCIPI</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_JP2006112793A
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title IC HANDLER APPARATUS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-13T13%3A23%3A33IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KAWAMURA%20SHINICHIRO&rft.date=2006-04-27&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2006112793A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true