IC HANDLER APPARATUS

IC HANDLER APPARATUS

PROBLEM TO BE SOLVED: To provide an IC handler apparatus capable of inspecting an IC device of high temperature characteristics precisely at low cost. SOLUTION: The IC handler apparatus is characteristically provided with a hot air blowing means for blowing against the IC device with the hot air, a...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: KAWAMURA SHINICHIRO
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide an IC handler apparatus capable of inspecting an IC device of high temperature characteristics precisely at low cost. SOLUTION: The IC handler apparatus is characteristically provided with a hot air blowing means for blowing against the IC device with the hot air, a device guide for moving and setting the IC on a socket and at least one ventilation part provided on the device guide so as to blow against the IC device with the hot air from the hot air blowing means. COPYRIGHT: (C)2006,JPO&NCIPI