SIGNAL INSPECTION CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE

PROBLEM TO BE SOLVED: To provide a signal inspection circuit capable of performing the operation of inspecting whether a plurality of binary signals have a predetermined expectation value, and the operation of selecting and outputting a part of the plurality of inputted binary signals with a simple...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	AKAMATSU MASASHI
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE PHYSICS STATIC STORES
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