MEASURING TOOL AND MEASURING METHOD

PROBLEM TO BE SOLVED: To measure the relative position between a reference surface and a free curved surface of a die by a general-use noncontact three-dimensional measuring device. SOLUTION: This tool 6 is equipped with a measuring reference surface 7 to be in contact respectively with reference su...

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1. Verfasser: URANO MASAHIRO
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To measure the relative position between a reference surface and a free curved surface of a die by a general-use noncontact three-dimensional measuring device. SOLUTION: This tool 6 is equipped with a measuring reference surface 7 to be in contact respectively with reference surfaces of the die wherein two side surfaces are used as the reference surfaces. which is a die having the free curved surface; and a Z-reference surface 8 which is a plane crossing the measuring reference surface 7 at a designed angle formed between the free curved surface and the reference surface. A reference plane is defined based on a result of plane measurement relative to the Z-reference surface 8 in the state where the die is interfitted into the tool 6, and an XY coordinate system is defined on the reference plane based on a result of straight line measurement relative to a straight line 9 formed by crossing between the measuring reference surface 7 and the Z-reference surface, and fitting is applied to a result of free curved surface measurement relative to the free curved surface when the coordinate origin in the XY coordinate system is used as a measuring origin, and a measuring result of the relative position is acquired from a value acquired as a fitting result. COPYRIGHT: (C)2006,JPO&NCIPI