SYSTEM AND METHOD FOR MONITORING LASER SHOCK PEENING PROCESS

PROBLEM TO BE SOLVED: To provide a system designed to monitor a laser shock peening process that can operate on a real-time basis. SOLUTION: A line spectrum can be obtained from radiation emitted from plasma (32) generated from a laser shock peening process. To verify appropriate behaviors of the la...

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Hauptverfasser:	AZER MAGDI N, BENICEWICZ PAMELA K, PINGFAN PETER WU
Format:	Patent
Sprache:	eng
Schlagworte:	CHEMISTRY CLADDING OR PLATING BY SOLDERING OR WELDING COLORIMETRY COMBINED OPERATIONS CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING GENERAL DEVICES FOR HEAT TREATMENT OF FERROUS OR NON-FERROUSMETALS OR ALLOYS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MACHINE TOOLS MAKING METAL MALLEABLE BY DECARBURISATION, TEMPERING OR OTHERTREATMENTS MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING METAL-WORKING NOT OTHERWISE PROVIDED FOR METALLURGY METALLURGY OF IRON MODIFYING THE PHYSICAL STRUCTURE OF FERROUS METALS OTHER WORKING OF METAL PERFORMING OPERATIONS PHYSICS RADIATION PYROMETRY SOLDERING OR UNSOLDERING TESTING TRANSPORTING UNIVERSAL MACHINE TOOLS WELDING WORKING BY LASER BEAM
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a system designed to monitor a laser shock peening process that can operate on a real-time basis. SOLUTION: A line spectrum can be obtained from radiation emitted from plasma (32) generated from a laser shock peening process. To verify appropriate behaviors of the laser shock peening process, shapes of line spectrum centered on the light issuance peak are compared with the shapes of the defined line. The line shape may be the Lorentz line shape corresponding to the desirable line shape. The line shape may also be the Gaussian line shape corresponding to an undesirable line shape. Further, the system (14) can detect the impedance mode that arises when a non-transparent layer (22) is destroyed, by detecting plasma spectrum components generated from the material of work together with the plasma generated from the non-transparent layer (22). COPYRIGHT: (C)2006,JPO&NCIPI