CVD TREATING METHOD

PROBLEM TO BE SOLVED: To improve the utilization rates of a semiconductor manufacturing apparatus, in which a burden of cleaning is remarkably alleviated by preventing the formation of a solid film on a wall surface of a flow passage. SOLUTION: The apparatus comprises a fixed part such as a valve bo...

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Hauptverfasser: TOMEZUKA KOJI, FURUICHI MASAYOSHI
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creator TOMEZUKA KOJI
FURUICHI MASAYOSHI
description PROBLEM TO BE SOLVED: To improve the utilization rates of a semiconductor manufacturing apparatus, in which a burden of cleaning is remarkably alleviated by preventing the formation of a solid film on a wall surface of a flow passage. SOLUTION: The apparatus comprises a fixed part such as a valve box having a gas flow passage, in which exhaust gas is discharged with CVD treating in a reaction chamber, and a movable part such as a valve body that opens and closes the gas flow passage. When the gas passes inside the gas flow passage of a valve device, in which a heater for the fixed part is fixed to the fixed part, the heater for the fixed part heats the fixed part. COPYRIGHT: (C)2006,JPO&NCIPI
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2006080558A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2006080558A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2006080558A3</originalsourceid><addsrcrecordid>eNrjZBB2DnNRCAlydQzx9HNX8HUN8fB34WFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgYGZgYWBqamFo7GRCkCAIwNHq4</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>CVD TREATING METHOD</title><source>esp@cenet</source><creator>TOMEZUKA KOJI ; FURUICHI MASAYOSHI</creator><creatorcontrib>TOMEZUKA KOJI ; FURUICHI MASAYOSHI</creatorcontrib><description>PROBLEM TO BE SOLVED: To improve the utilization rates of a semiconductor manufacturing apparatus, in which a burden of cleaning is remarkably alleviated by preventing the formation of a solid film on a wall surface of a flow passage. SOLUTION: The apparatus comprises a fixed part such as a valve box having a gas flow passage, in which exhaust gas is discharged with CVD treating in a reaction chamber, and a movable part such as a valve body that opens and closes the gas flow passage. When the gas passes inside the gas flow passage of a valve device, in which a heater for the fixed part is fixed to the fixed part, the heater for the fixed part heats the fixed part. COPYRIGHT: (C)2006,JPO&amp;NCIPI</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; CHEMICAL SURFACE TREATMENT ; CHEMISTRY ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL ; COATING MATERIAL WITH METALLIC MATERIAL ; COATING METALLIC MATERIAL ; DIFFUSION TREATMENT OF METALLIC MATERIAL ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL ; METALLURGY ; SEMICONDUCTOR DEVICES ; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20060323&amp;DB=EPODOC&amp;CC=JP&amp;NR=2006080558A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25566,76549</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20060323&amp;DB=EPODOC&amp;CC=JP&amp;NR=2006080558A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TOMEZUKA KOJI</creatorcontrib><creatorcontrib>FURUICHI MASAYOSHI</creatorcontrib><title>CVD TREATING METHOD</title><description>PROBLEM TO BE SOLVED: To improve the utilization rates of a semiconductor manufacturing apparatus, in which a burden of cleaning is remarkably alleviated by preventing the formation of a solid film on a wall surface of a flow passage. SOLUTION: The apparatus comprises a fixed part such as a valve box having a gas flow passage, in which exhaust gas is discharged with CVD treating in a reaction chamber, and a movable part such as a valve body that opens and closes the gas flow passage. When the gas passes inside the gas flow passage of a valve device, in which a heater for the fixed part is fixed to the fixed part, the heater for the fixed part heats the fixed part. COPYRIGHT: (C)2006,JPO&amp;NCIPI</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CHEMICAL SURFACE TREATMENT</subject><subject>CHEMISTRY</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</subject><subject>COATING MATERIAL WITH METALLIC MATERIAL</subject><subject>COATING METALLIC MATERIAL</subject><subject>DIFFUSION TREATMENT OF METALLIC MATERIAL</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</subject><subject>METALLURGY</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBB2DnNRCAlydQzx9HNX8HUN8fB34WFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgYGZgYWBqamFo7GRCkCAIwNHq4</recordid><startdate>20060323</startdate><enddate>20060323</enddate><creator>TOMEZUKA KOJI</creator><creator>FURUICHI MASAYOSHI</creator><scope>EVB</scope></search><sort><creationdate>20060323</creationdate><title>CVD TREATING METHOD</title><author>TOMEZUKA KOJI ; FURUICHI MASAYOSHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2006080558A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2006</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CHEMICAL SURFACE TREATMENT</topic><topic>CHEMISTRY</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL</topic><topic>COATING MATERIAL WITH METALLIC MATERIAL</topic><topic>COATING METALLIC MATERIAL</topic><topic>DIFFUSION TREATMENT OF METALLIC MATERIAL</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL</topic><topic>METALLURGY</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION</topic><toplevel>online_resources</toplevel><creatorcontrib>TOMEZUKA KOJI</creatorcontrib><creatorcontrib>FURUICHI MASAYOSHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TOMEZUKA KOJI</au><au>FURUICHI MASAYOSHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CVD TREATING METHOD</title><date>2006-03-23</date><risdate>2006</risdate><abstract>PROBLEM TO BE SOLVED: To improve the utilization rates of a semiconductor manufacturing apparatus, in which a burden of cleaning is remarkably alleviated by preventing the formation of a solid film on a wall surface of a flow passage. SOLUTION: The apparatus comprises a fixed part such as a valve box having a gas flow passage, in which exhaust gas is discharged with CVD treating in a reaction chamber, and a movable part such as a valve body that opens and closes the gas flow passage. When the gas passes inside the gas flow passage of a valve device, in which a heater for the fixed part is fixed to the fixed part, the heater for the fixed part heats the fixed part. COPYRIGHT: (C)2006,JPO&amp;NCIPI</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
CHEMICAL SURFACE TREATMENT
CHEMISTRY
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING MATERIAL WITH METALLIC MATERIAL
COATING METALLIC MATERIAL
DIFFUSION TREATMENT OF METALLIC MATERIAL
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL
METALLURGY
SEMICONDUCTOR DEVICES
SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION
title CVD TREATING METHOD
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