DETECTING METHOD AND DEVICE IN CHARGE-TRAPPING NONVOLATILE MEMORY

DETECTING METHOD AND DEVICE IN CHARGE-TRAPPING NONVOLATILE MEMORY

PROBLEM TO BE SOLVED: To read a memory cell having a charge-trapping structure by measuring the current between the substrate area of the memory all and one of the source area and the drain area of the memory cell. SOLUTION: When the other sections of the charge-trapping structure store unrelated da...

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1. Verfasser: YEH CHIHIEH
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INFORMATION STORAGE
PHYSICS
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Zusammenfassung:PROBLEM TO BE SOLVED: To read a memory cell having a charge-trapping structure by measuring the current between the substrate area of the memory all and one of the source area and the drain area of the memory cell. SOLUTION: When the other sections of the charge-trapping structure store unrelated data, the read operation reduces the coupling between the other sections different in the charge-trapping structure. The detection window of the memory cell is significantly improved by this read operation. COPYRIGHT: (C)2006,JPO&NCIPI