DEFECT MANAGEMENT ENABLED PIRM AND METHOD

PROBLEM TO BE SOLVED: To provide a defect management method for a defect management enabled PIRM. SOLUTION: A defect management enabled PIRM (100) includes a data storage medium providing a plurality of cross point data storage arrays (302, 304, 306, and 308). Each array (302) provides a plurality o...

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Bibliographische Detailangaben
Hauptverfasser: ELDER RICHARD E, TAUSSIG CARL P
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a defect management method for a defect management enabled PIRM. SOLUTION: A defect management enabled PIRM (100) includes a data storage medium providing a plurality of cross point data storage arrays (302, 304, 306, and 308). Each array (302) provides a plurality of memory cells (300). The arrays (302, 304,306, and 308) are allocated into separate super arrays (310, 330 and 332), the separate super arrays are virtually aligned as sets. A controller is also provided, capable of establishing the selection of a virtually aligned set of arrays (302, 312, and 322) and a virtually aligned set of memory cells (300). The controller is operable during a write operation to receive a word of data bits and detect a defective array in the selected virtually aligned set of memory arrays (302, 312, and 322). COPYRIGHT: (C)2006,JPO&NCIPI