EVENT EXTRACTION SAMPLING

EVENT EXTRACTION SAMPLING

PROBLEM TO BE SOLVED: To extract a taken-out event to be sampled, as to an improvement of a logic analyzer. SOLUTION: The logic analyzer 1 of the present invention is constituted of an event extraction circuit 3 and memory 4, and is constituted to control right permission for the memory 4 by an extr...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: NISHINO MITSUHIRO
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To extract a taken-out event to be sampled, as to an improvement of a logic analyzer. SOLUTION: The logic analyzer 1 of the present invention is constituted of an event extraction circuit 3 and memory 4, and is constituted to control right permission for the memory 4 by an extraction setting condition consistent output output from the event extraction circuit 3, when measuring a measured signal. COPYRIGHT: (C)2006,JPO&NCIPI