MEASUREMENT DEVICE AND CALIBRATION SYSTEM USING IT

PROBLEM TO BE SOLVED: To provide a measurement device and a calibration system using it capable of quickly performing a high precision calibration. SOLUTION: The measurement device connected with a standard equipment adjusted or calibrated on the basis of the standard output value of this standard e...

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Bibliographische Detailangaben
1. Verfasser:	KASUMI YOSHINOBU
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CALCULATING COMPUTING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a measurement device and a calibration system using it capable of quickly performing a high precision calibration. SOLUTION: The measurement device connected with a standard equipment adjusted or calibrated on the basis of the standard output value of this standard equipment is provided with a program for controlling the standard equipment and the measurement device, and is adjusted or calibrated according to the order from the program. COPYRIGHT: (C)2006,JPO&NCIPI