ELECTRONIC COMPONENT INSPECTING PROBE, AND ELECTRONIC COMPONENT INSPECTING SPLICER PROVIDED WITH SAME

PROBLEM TO BE SOLVED: To provide a probe 1 of high durability and a long life capable of making the probe 1 thin and short, and capable of maintaining a favorable contact condition without losing biasing force of the probe 1 with pressure contact, and a splicer provided the probe 1. SOLUTION: This e...

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Bibliographische Detailangaben

1. Verfasser:	IKEDA SHUZO
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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