ELECTRONIC COMPONENT INSPECTING PROBE, AND ELECTRONIC COMPONENT INSPECTING SPLICER PROVIDED WITH SAME

PROBLEM TO BE SOLVED: To provide a probe 1 of high durability and a long life capable of making the probe 1 thin and short, and capable of maintaining a favorable contact condition without losing biasing force of the probe 1 with pressure contact, and a splicer provided the probe 1. SOLUTION: This e...

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Bibliographische Detailangaben
1. Verfasser:	IKEDA SHUZO
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a probe 1 of high durability and a long life capable of making the probe 1 thin and short, and capable of maintaining a favorable contact condition without losing biasing force of the probe 1 with pressure contact, and a splicer provided the probe 1. SOLUTION: This electronic component inspecting probe 1 is provided with a barrel 10 having an opening at least with an opened one end, and a plunger 20 with one end inserted from the opening 11 of the barrel 10 to be moved advancedly and retractedly inside the barrel 10, a hole 15 is formed in a side face of the barrel 10, and elastic bodies 30a, 30b are arranged at least in one-portions of a barrel 10 inside and an outer circumference of the barrel 10, via the hole 15. COPYRIGHT: (C)2006,JPO&NCIPI