PROBE FOR PROBE MICROSCOPE AND ITS MANUFACTURING METHOD, PROBE MICROSCOPE, NEEDLE-SHAPED BODY AND ITS MANUFACTURING METHOD, AND ELECTRONIC ELEMENT AND ITS MANUFACTURING METHOD

PROBLEM TO BE SOLVED: To provide a probe for a probe microscope, for highly accurately performing analysis of a charge density wave nano structure, structure determination on biomacromolecules, etc. by actively utilizing macroscopic quantum phase information on a charge density wave, and moreover, s...

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Bibliographische Detailangaben
Hauptverfasser:	OKAWA HIROYUKI, TOYOSHIMA GOJI, INAGAKI KATSUHIKO, TANDA SATOSHI
Format:	Patent
Sprache:	eng
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] MANUFACTURE OR TREATMENT THEREOF MEASURING NANOSTRUCTURES FORMED BY MANIPULATION OF INDIVIDUAL ATOMS,MOLECULES, OR LIMITED COLLECTIONS OF ATOMS OR MOLECULES ASDISCRETE UNITS NANOTECHNOLOGY PERFORMING OPERATIONS PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING TRANSPORTING
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Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a probe for a probe microscope, for highly accurately performing analysis of a charge density wave nano structure, structure determination on biomacromolecules, etc. by actively utilizing macroscopic quantum phase information on a charge density wave, and moreover, suitably used for a downsized charge density wave quantum phase microscope, etc. SOLUTION: A material film 22 is deposited on a surface of a conical body 21 made of Si, etc. An electronic beam 23 is irradiated to a part a prescribed distance away from an end part of the conical body 21 along its side surface on condition that the conical body 21 is kept from melting. This causes a needle crystal 24 to grow with the material film 22 used, thereby manufacturing the probe for a probe microscope. COPYRIGHT: (C)2006,JPO&NCIPI