TEST SUPPORT DEVICE AND METHOD

PROBLEM TO BE SOLVED: To detect failures occurring in a new computer of a test system and efficiently analyze causes thereof when parallel operation tests are conducted in order to replace an existing computer of a real system with the new computer of the test system. SOLUTION: The test support devi...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SUYAMA TAKASHI, SUMITA NOBUO, UEDA TOYOHIKO, OSUGI YASUO
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To detect failures occurring in a new computer of a test system and efficiently analyze causes thereof when parallel operation tests are conducted in order to replace an existing computer of a real system with the new computer of the test system. SOLUTION: The test support device is provided with a comparison means 213 for comparing operational results outputted from the existing computer 11 with operational results outputted from the new computer 22, and an operational history storage means 214 for controlling the device to store the operational history of the new computer 11 if the comparison by the comparison means 213 shows that the operational results outputted from the existing computer 11 are different from those outputted from the new computer 22. In this way it is made possible to automatically detect any failure occurring in the new computer 22. COPYRIGHT: (C)2006,JPO&NCIPI