NUMERICAL ANALYSIS SYSTEM

PROBLEM TO BE SOLVED: To provide a numerical analysis system capable of modelizing contact resistance without requiring massive man-hour. SOLUTION: The numerical analysis system (10) has an analysis model generating means (21) generating an analysis model (60) to be analyzed, by interposing a fine m...

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Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a numerical analysis system capable of modelizing contact resistance without requiring massive man-hour. SOLUTION: The numerical analysis system (10) has an analysis model generating means (21) generating an analysis model (60) to be analyzed, by interposing a fine mesh (52) having a definition of contact resistance among mesh models (51) formed by modelizing constituent members constituting the objects to be analyzed; and a numerical analysis member (22) numerically analyzing electric property of the object to be analyzed depending on the analysis model (60). It becomes possible to omit the definition of the contact resistance by interposing the fine mesh (52) having a definition of contact resistance among the mesh models (51) formed by modelizing the constituent members, and the contact resistance can be modelized without requiring massive man-hour. COPYRIGHT: (C)2006,JPO&NCIPI