MEMORY CARD

PROBLEM TO BE SOLVED: To considerably lengthen the service life of a memory card following the occurrence of a defective block. SOLUTION: A control logic searches the presence of an acquired defect in a block of a flash memory based on a defect factor code stored in a management information part of...

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Bibliographische Detailangaben
Hauptverfasser: SHINAGAWA CHIAKI, SHIRAISHI ATSUSHI, NAKAMURA YASUHIRO, ASARI SHINSUKE, KANAMORI SAKAKI
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To considerably lengthen the service life of a memory card following the occurrence of a defective block. SOLUTION: A control logic searches the presence of an acquired defect in a block of a flash memory based on a defect factor code stored in a management information part of the flash memory, performs write/read comparison of data to the defective block in the case of detecting the defective block, and determines whether the block is normal. The block determined to be normal is registered as a normal block by rewriting a defect factor code of the corresponding block, and the registered block is stored as a writable block in a write management table of a management region. The originally normal block determined to be defective by an erratic error or the like can thereby be recovered. COPYRIGHT: (C)2006,JPO&NCIPI