SYSTEM AND METHOD FOR DEVICE INSPECTION

PROBLEM TO BE SOLVED: To provide a system and method for device inspection that can increase the efficiency of and reduce the costs of device assembly or inspection. SOLUTION: The system for device inspection comprises a maker server 124 accumulating pre-assembly inspection data obtained by inspecti...

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Bibliographische Detailangaben
1. Verfasser:	TAKAHASHI AKITOSHI
Format:	Patent
Sprache:	eng
Schlagworte:	CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION ORPROCESSING OF GOODS CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINSTCLIMATE CHANGE
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a system and method for device inspection that can increase the efficiency of and reduce the costs of device assembly or inspection. SOLUTION: The system for device inspection comprises a maker server 124 accumulating pre-assembly inspection data obtained by inspections in a factory of components of a device including a housing 1, parts 2, units 3 and boards 4 in a stage before their assembly into the complete device in the factory, and post-assembly inspection data obtained by inspections of the device in a stage after the assembly of the components into the complete device on the installation site of the device; and an orderer terminal 126, a prime contractor terminal 127 and vendor terminals 128 capable of browsing the pre/post-assembly inspection data in the server. COPYRIGHT: (C)2006,JPO&NCIPI