RESIST PEELING DEVICE, RESIST PEELING METHOD USING THE SAME, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

PROBLEM TO BE SOLVED: To provide an inexpensive and environment-friendly resist peeling device which does not use plasma causing damage during a resist peeling process in manufacturing a semiconductor device and a liquid crystal panel. SOLUTION: The resist peeling device includes a wafer support 102...

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description PROBLEM TO BE SOLVED: To provide an inexpensive and environment-friendly resist peeling device which does not use plasma causing damage during a resist peeling process in manufacturing a semiconductor device and a liquid crystal panel. SOLUTION: The resist peeling device includes a wafer support 102, a valve 104 provided on an exhaust pipe, a waste liquid pipe 105, a steam generator 107, a steam jet nozzle 108, a valve 109 provided on a gas pipe, a vacuum pump 110, and a nozzle 111 for rinsing. A wafer 101 is placed in a container in the device, and steam is jetted and filled into the container from the nozzle 108 to raise the pressure in the container to liquefy the steam for penetrating the steam into the wafer 101. Thereafter, the pressure is reduced in a sealed state to cause part of the liquefied steam to vaporize again, causing a crack on a resist to have the resist peeled. COPYRIGHT: (C)2005,JPO&NCIPI
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2005259743A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2005259743A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2005259743A3</originalsourceid><addsrcrecordid>eNrjZMgNcg32DA5RCHB19fH0c1dwcQ3zdHbVUUAT9nUN8fB3UQgNBnFCPFwVgh19gaoc_VwUfB39Qt0cnUNCg5AU-rspBLv6ejr7-7mEOof4B0HN5WFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgYGpkamluYmxo7GRCkCAHJHNzA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>RESIST PEELING DEVICE, RESIST PEELING METHOD USING THE SAME, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE</title><source>esp@cenet</source><creator>OGURA TAKEISA</creator><creatorcontrib>OGURA TAKEISA</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide an inexpensive and environment-friendly resist peeling device which does not use plasma causing damage during a resist peeling process in manufacturing a semiconductor device and a liquid crystal panel. SOLUTION: The resist peeling device includes a wafer support 102, a valve 104 provided on an exhaust pipe, a waste liquid pipe 105, a steam generator 107, a steam jet nozzle 108, a valve 109 provided on a gas pipe, a vacuum pump 110, and a nozzle 111 for rinsing. A wafer 101 is placed in a container in the device, and steam is jetted and filled into the container from the nozzle 108 to raise the pressure in the container to liquefy the steam for penetrating the steam into the wafer 101. Thereafter, the pressure is reduced in a sealed state to cause part of the liquefied steam to vaporize again, causing a crack on a resist to have the resist peeled. COPYRIGHT: (C)2005,JPO&amp;NCIPI</description><edition>7</edition><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; CLEANING ; CLEANING IN GENERAL ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; PERFORMING OPERATIONS ; PREVENTION OF FOULING IN GENERAL ; SEMICONDUCTOR DEVICES ; TRANSPORTING</subject><creationdate>2005</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20050922&amp;DB=EPODOC&amp;CC=JP&amp;NR=2005259743A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20050922&amp;DB=EPODOC&amp;CC=JP&amp;NR=2005259743A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>OGURA TAKEISA</creatorcontrib><title>RESIST PEELING DEVICE, RESIST PEELING METHOD USING THE SAME, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE</title><description>PROBLEM TO BE SOLVED: To provide an inexpensive and environment-friendly resist peeling device which does not use plasma causing damage during a resist peeling process in manufacturing a semiconductor device and a liquid crystal panel. SOLUTION: The resist peeling device includes a wafer support 102, a valve 104 provided on an exhaust pipe, a waste liquid pipe 105, a steam generator 107, a steam jet nozzle 108, a valve 109 provided on a gas pipe, a vacuum pump 110, and a nozzle 111 for rinsing. A wafer 101 is placed in a container in the device, and steam is jetted and filled into the container from the nozzle 108 to raise the pressure in the container to liquefy the steam for penetrating the steam into the wafer 101. Thereafter, the pressure is reduced in a sealed state to cause part of the liquefied steam to vaporize again, causing a crack on a resist to have the resist peeled. COPYRIGHT: (C)2005,JPO&amp;NCIPI</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CLEANING</subject><subject>CLEANING IN GENERAL</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>PERFORMING OPERATIONS</subject><subject>PREVENTION OF FOULING IN GENERAL</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2005</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZMgNcg32DA5RCHB19fH0c1dwcQ3zdHbVUUAT9nUN8fB3UQgNBnFCPFwVgh19gaoc_VwUfB39Qt0cnUNCg5AU-rspBLv6ejr7-7mEOof4B0HN5WFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgYGpkamluYmxo7GRCkCAHJHNzA</recordid><startdate>20050922</startdate><enddate>20050922</enddate><creator>OGURA TAKEISA</creator><scope>EVB</scope></search><sort><creationdate>20050922</creationdate><title>RESIST PEELING DEVICE, RESIST PEELING METHOD USING THE SAME, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE</title><author>OGURA TAKEISA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2005259743A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2005</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CLEANING</topic><topic>CLEANING IN GENERAL</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>PERFORMING OPERATIONS</topic><topic>PREVENTION OF FOULING IN GENERAL</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>OGURA TAKEISA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>OGURA TAKEISA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>RESIST PEELING DEVICE, RESIST PEELING METHOD USING THE SAME, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE</title><date>2005-09-22</date><risdate>2005</risdate><abstract>PROBLEM TO BE SOLVED: To provide an inexpensive and environment-friendly resist peeling device which does not use plasma causing damage during a resist peeling process in manufacturing a semiconductor device and a liquid crystal panel. SOLUTION: The resist peeling device includes a wafer support 102, a valve 104 provided on an exhaust pipe, a waste liquid pipe 105, a steam generator 107, a steam jet nozzle 108, a valve 109 provided on a gas pipe, a vacuum pump 110, and a nozzle 111 for rinsing. A wafer 101 is placed in a container in the device, and steam is jetted and filled into the container from the nozzle 108 to raise the pressure in the container to liquefy the steam for penetrating the steam into the wafer 101. Thereafter, the pressure is reduced in a sealed state to cause part of the liquefied steam to vaporize again, causing a crack on a resist to have the resist peeled. COPYRIGHT: (C)2005,JPO&amp;NCIPI</abstract><edition>7</edition><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
CLEANING
CLEANING IN GENERAL
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
PERFORMING OPERATIONS
PREVENTION OF FOULING IN GENERAL
SEMICONDUCTOR DEVICES
TRANSPORTING
title RESIST PEELING DEVICE, RESIST PEELING METHOD USING THE SAME, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-10T18%3A21%3A58IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=OGURA%20TAKEISA&rft.date=2005-09-22&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2005259743A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true