OPTICAL DEFECT INSPECTION DEVICE FOR METAL BAND

PROBLEM TO BE SOLVED: To inspect a surface defect of a metal band at the same detection angle by use of a two-dimensional imaging means. SOLUTION: When an inspection image is input from a steel plate S carried in the longitudinal direction by a two-dimensional CCD camera 10, and its surface defect i...

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1. Verfasser:	TOMURA YASUO
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To inspect a surface defect of a metal band at the same detection angle by use of a two-dimensional imaging means. SOLUTION: When an inspection image is input from a steel plate S carried in the longitudinal direction by a two-dimensional CCD camera 10, and its surface defect inspection is performed on the basis of the image, the CCD camera 10 is arranged opposite to the steel plate S so that the scanning direction of a pixel string is substantially matched to the lateral direction of the steel plate S, and unit images corresponding to a specified pixel string of the m-th line input by scanning at temporally different times are composed in the longitudinal direction of the steel plate S to form the inspection image. COPYRIGHT: (C)2005,JPO&NCIPI