ATTACHMENT FOR ANALYZER AND ANALYZER USING IT

PROBLEM TO BE SOLVED: To provide an analyzer capable of performing gas purge of an attachment simply and excellently. SOLUTION: This attachment 12 for the analyzer provided detachably on a body 14 of the analyzer 10 is equipped with an optical system constituent member 18 for performing optical anal...

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Bibliographische Detailangaben
Hauptverfasser: AKAO KENICHI, MATSUDA KIYOHARU, MINEO HIROSHI, KASHIWABARA HARUICHI, SOGA YOSHIAKI
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide an analyzer capable of performing gas purge of an attachment simply and excellently. SOLUTION: This attachment 12 for the analyzer provided detachably on a body 14 of the analyzer 10 is equipped with an optical system constituent member 18 for performing optical analysis together with the body 14. The attachment 12 for the analyzer is characterized as follows: the optical system constituent member 18 is provided; an attachment base 20 to be brought into contact with the analyzer body 14 when setting the attachment for the analyzer on the analyzer body 14 is provided; the attachment base 20 is provided with a purging hole 24 positioned on the periphery on an optical path 22 in the attachment 12 for the analyzer; and the periphery of the optical system constituent member 18 provided on the attachment base 20 is gas-purged through the purging hole 24 of the attachment base 20. COPYRIGHT: (C)2005,JPO&NCIPI