INSPECTION METHOD AND INSPECTION DEVICE FOR ARRAY SUBSTRATE

PROBLEM TO BE SOLVED: To provide an inspection method and an inspection device which can shorten the inspection time of an array substrate for a liquid crystal display device. SOLUTION: The array substrate 10 is divided into two inspection blocks 10A and 10B and one scanning signal line 2 selected f...

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Hauptverfasser:	MEGATA KEITOKU, NISHIYAMA HIROTERU, TAGUCHI TOMOYUKI, KOMATSU SHUNICHI, IWAMI TSUKASA
Format:	Patent
Sprache:	eng
Schlagworte:	ADVERTISING CRYPTOGRAPHY DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING DISPLAY DISPLAYING EDUCATION FREQUENCY-CHANGING LABELS OR NAME-PLATES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS SEALS SIGNS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide an inspection method and an inspection device which can shorten the inspection time of an array substrate for a liquid crystal display device. SOLUTION: The array substrate 10 is divided into two inspection blocks 10A and 10B and one scanning signal line 2 selected from each of the inspection blocks, i.e. two scanning signal lines in total are selected and inspected to specify a pixel address of a candidate for a defective. Then the array substrate 10 is divided into three inspection blocks 10C, 10D, and 10E and one scanning signal line 2 of each inspection block, i.e. three scanning signal lines 2 in total are selected and inspected again at the same time to specify a pixel address of a candidate for a defective. Then a pixel address which is common to the 1st inspection and re-inspection is specified as a defective address. COPYRIGHT: (C)2005,JPO&NCIPI