NEAR FIELD SPECTROSCOPIC ANALYZER AND SPECTROSCOPIC ANALYTICAL METHOD USED IN COMBINATION WITH CHROMATOGRAPH

PROBLEM TO BE SOLVED: To provide an analyzer and an analytical method of high sensitivity used in combination with a chromatograph and a near field spectroscopic analyzer. SOLUTION: This near field spectroscopic analyzer and analytical method used in combination with the chromatograph is provided wi...

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Hauptverfasser:	TAKAZAWA NOBUAKI, SHIMAZAKI RYUJI
Format:	Patent
Sprache:	eng
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide an analyzer and an analytical method of high sensitivity used in combination with a chromatograph and a near field spectroscopic analyzer. SOLUTION: This near field spectroscopic analyzer and analytical method used in combination with the chromatograph is provided with a chromatograph part and a near field spectroscopic analyzer part. In the analyzer and the analytical method, a sample is moved just to an under side of a probe in the near field spectroscopic analyzer part by moving a stage, to be analyzed, after the sample separated by the chromatograph part is mounted on the stage to be enriched and fixed by cooling or heating, and the analysis-finished sample is moved to another position by moving the stage, to be removed by heating. COPYRIGHT: (C)2005,JPO&NCIPI