SURFACE IRREGULARITY MEASURING/EVALUATING METHOD AND SYSTEM, SURFACE IRREGULARITY EVALUATION DEVICE, AND PROGRAM OF SURFACE IRREGULARITY MEASURING/EVALUATING METHOD

PROBLEM TO BE SOLVED: To provide a measuring/evaluating method or the like capable of measurement/evaluation to the degree of quantitative roping having excellent reproducibility or the like without depending on human sensitivity. SOLUTION: This method has a process for irradiating the measuring obj...

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Hauptverfasser:	TORAO AKIRA, KODAMA TOSHIBUMI
Format:	Patent
Sprache:	eng
Schlagworte:	AUXILIARY OPERATIONS USED IN CONNECTION WITH METAL-WORKINGWITHOUT ESSENTIALLY REMOVING MATERIAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MANUFACTURE OF METAL SHEETS, WIRE, RODS, TUBES OR PROFILES,OTHERWISE THAN BY ROLLING MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVINGMATERIAL PERFORMING OPERATIONS PHYSICS PUNCHING METAL TESTING TRANSPORTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a measuring/evaluating method or the like capable of measurement/evaluation to the degree of quantitative roping having excellent reproducibility or the like without depending on human sensitivity. SOLUTION: This method has a process for irradiating the measuring object surface with light by a metal halide light source 12 at a prescribed incident angle, a process for receiving light reflected from the surface at an angle corresponding to a reflection angle approximately equal to the incident angle by a CCD camera 15, and converting the reflected light into data of a light intensity distribution, and a process for calculating by an operation device 17 by using an intensity change of light on the surface as an index based on the data. COPYRIGHT: (C)2005,JPO&NCIPI