MULTANGULAR REFLECTED LIGHT MEASURING DEVICE

PROBLEM TO BE SOLVED: To provide a multangular reflected light measuring device capable of quantitating the surface state of a measuring object by measuring fine multangular reflected light from the measuring object. SOLUTION: This multangular reflected light measuring device has a light source for irradiating the measuring object with light, a measuring means for performing measuring processing of incident light, and reflection parts for performing optical path conversion of reflected light irradiated from the light source and reflected by the measuring object toward the measuring means. The device is characterized by having a constitution wherein the plurality of reflection parts are arranged in an arch shape on the measuring object, and the reflected light in a plurality of directions reflected by the measuring object is reflected at one time toward the measuring means by the plurality of reflection parts. COPYRIGHT: (C)2005,JPO&NCIPI