QUALITY IMPROVEMENT SYSTEM

PROBLEM TO BE SOLVED: To provide a quality improvement system which improves the work efficiency of an engineer by systematizing his or her analysis method accompanied by quality improvement. SOLUTION: Definition files of analysis procedures set by the engineer are accumulated in a knowledge DB 15 o...

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Bibliographische Detailangaben
1. Verfasser:	TOYOFUKU TAKESHI
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING SEMICONDUCTOR DEVICES SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a quality improvement system which improves the work efficiency of an engineer by systematizing his or her analysis method accompanied by quality improvement. SOLUTION: Definition files of analysis procedures set by the engineer are accumulated in a knowledge DB 15 of a knowledge server 12, and prescribed data is acquired from an external DB 18 to perform data analysis in accordance with the analysis procedures by an application server 13. Reference information inputted from a client server 14 is added to an analysis result, and the analysis result is accumulated in the knowledge DB 15. The degree of importance is determined by the reference information, and a definition file of analysis procedures having a high degree of importance is extracted from the knowledge DB 15. COPYRIGHT: (C)2005,JPO&NCIPI