ANALYZING METHOD USING PROJECTING REGION

PROBLEM TO BE SOLVED: To carry out a highly precise analysis of an object to be analyzed while suppressing influences of non-analysis section in a substrate, and to enable multiple samples or multiple terms to be simultaneously analyzed by using a simple device structure, when a quantitative analysis or a qualitative analysis of the analyzed object is carried out on an analysis section in the substrate. SOLUTION: In an analyzing method which makes the analyzed object react to a reactant 3 directly or indirectly reacting to the analyzed object on the analysis section A in the substrate 1 and which detects a generated signal originating from this reaction, a signal generation relating section 4x or a detector is disposed at an opposite section opposed to the substrate 1 at least in a signal detection step, and a projecting / recessed section is formed in at least one of the substrate 1 and the opposite section so that the distance between the opposite section and the analysis section A of the substrate 1 is shorter than that between the opposite section and the non-analysis section B of the substrate, thereby detecting signals originating from the reaction in the analysis section A more strongly than signals originating from the reaction in the non-analysis section B. COPYRIGHT: (C)2005,JPO&NCIPI