WAVEFORM-MEASURING APPARATUS AND METHOD

PROBLEM TO BE SOLVED: To realize a waveform measuring apparatus and a waveform-measuring method capable of efficiently displaying a waveform of desired waveform data. SOLUTION: This invention is acquired, by improving a waveform measuring apparatus which stores a plurality of waveform data acquired...

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1. Verfasser: KUWABARA YOHEI
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To realize a waveform measuring apparatus and a waveform-measuring method capable of efficiently displaying a waveform of desired waveform data. SOLUTION: This invention is acquired, by improving a waveform measuring apparatus which stores a plurality of waveform data acquired by measuring a waveform to be measured, on the basis of a trigger signal in a data storage part and which displays the waveform of the waveform data in the data storage part on a display part. The apparatus comprises an identification information storage part for storing identification information; a marking means for storing the identification information for identifying desired waveform data among the waveform data of the data storage part in the identification information storage part; and a selection means for selecting the waveform data of the data storage part, on the basis of the identification information of the identification information storage part. COPYRIGHT: (C)2005,JPO&NCIPI