INSPECTION DEVICE FOR INSPECTING TFT

PROBLEM TO BE SOLVED: To provide an inspection device which precisely inspects a characteristic of TFT which supplies current to respective pixels constituting a display device. SOLUTION: The inspection device 10 inspects TFT (Thin-Film Transistor) supplying current to a light-emitting element. The...

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Bibliographische Detailangaben
Hauptverfasser:	MEGATA KEITOKU, IMURA KENICHI, TAGUCHI TOMOYUKI, SAKAGUCHI YOSHITAMI, NAKANO DAIKI
Format:	Patent
Sprache:	eng
Schlagworte:	ADVERTISING BASIC ELECTRIC ELEMENTS CRYPTOGRAPHY DISPLAY DISPLAYING EDUCATION ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY LABELS OR NAME-PLATES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEALS SEMICONDUCTOR DEVICES SIGNS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide an inspection device which precisely inspects a characteristic of TFT which supplies current to respective pixels constituting a display device. SOLUTION: The inspection device 10 inspects TFT (Thin-Film Transistor) supplying current to a light-emitting element. The device is provided with a first current supply circuit 100 supplying drain current between a drain and a source of TFT, a gate voltage adjusting circuit 110 adjusting gate voltage applied to a gate of TFT so that specified current which is previously decided flows between the drain and the source of TFT and a measuring part 120 for measuring gate voltage adjusted by the gate voltage adjusting circuit. COPYRIGHT: (C)2005,JPO&NCIPI