CRACK-DETECTING METHOD FOR SUBSTRATE, CRACK DETECTING APPARATUS THEREFOR, AND SOLAR CELL MODULE MANUFACTURING METHOD

PROBLEM TO BE SOLVED: To provide a crack-detecting method for a substrate, comprising a simplified equipment and processes. SOLUTION: The crack detecting method for a substrate comprises a step (1) of generating noise by application of a vibration to the substrate, a step (2) of capturing the noise...

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Hauptverfasser:	KAWAGOE YOSHIKAZU, KOZAI HIROSHI, YAGI KATSUYUKI
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS SEMICONDUCTOR DEVICES TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a crack-detecting method for a substrate, comprising a simplified equipment and processes. SOLUTION: The crack detecting method for a substrate comprises a step (1) of generating noise by application of a vibration to the substrate, a step (2) of capturing the noise and conducting an acoustic analysis for the same, for determining its power spectrum, and a step (3) of detecting the presence/absence of cracks in the substrate, based on the spectral intensity of a given frequency range. COPYRIGHT: (C)2005,JPO&NCIPI