SURFACE ANALYZER

PROBLEM TO BE SOLVED: To surely measure an element amount even in a high background. SOLUTION: This surface analyzer for detecting a secondary charged particle generated by irradiating a sample surface with a primary beam is provided with an energy analyzer for developing the secondary charged parti...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	IKEO NOBUYUKI
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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