TEST/MEASUREMENT METHOD OF ELECTRIC PROPERTY OF IC CHIP BUILT IN CONTACT TYPE IC CARD OR IC MODULE, TEST/MEASUREMENT SYSTEM AND STABILIZED POWER SUPPLY USED FOR IT

PROBLEM TO BE SOLVED: To provide a test/measurement method of electric properties of an IC chip built in a contact type IC card or an IC module, a test/measurement system and a stabilized power supply used for it, capable of measuring electric properties such as voltage, current with the contact typ...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	RYU KOREMASA, JINGU HIDEJI, OKADA YOSHIMASA
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING HANDLING RECORD CARRIERS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS TESTING
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