TEST/MEASUREMENT METHOD OF ELECTRIC PROPERTY OF IC CHIP BUILT IN CONTACT TYPE IC CARD OR IC MODULE, TEST/MEASUREMENT SYSTEM AND STABILIZED POWER SUPPLY USED FOR IT

PROBLEM TO BE SOLVED: To provide a test/measurement method of electric properties of an IC chip built in a contact type IC card or an IC module, a test/measurement system and a stabilized power supply used for it, capable of measuring electric properties such as voltage, current with the contact type IC card inserted into a reader/writer. SOLUTION: An expansion board 102 is inserted into the reader/writer R/W101, a socket board 108 is connected to the expansion board 102, and the IC card 109 is inserted into the socket board 108. Thereby, the reader/writer 101 and the IC card 109 are electrically connected. When a plug 113 to which an ampere meter 112 is connected is inserted into a jack 107 of the socket board 108, the consumption current of the IC card can be measured and by connecting measuring devices to respective measurement terminals 211-218 of the expansion board 102, the electric properties of the IC card 109 can be measured. COPYRIGHT: (C)2005,JPO&NCIPI