SEMICONDUCTOR INTEGRATED CIRCUIT AND ITS TEST METHOD

PROBLEM TO BE SOLVED: To test a circuit for high speed, using actual frequency, at a low cost. SOLUTION: A signal processor writes input test data in a memory with data width 2x bit at a frequency of f(MHz). A signal-switching part reads in test data A of 2x bit width of SIG5-1 according to read-in address controlled by a frequency of f(MHz) from the memory at a timing of the frequency f(MHz). The signal-switching part outputs the higher (x) bit of the test data A read-in from the memory to a test object circuit as a test data A-1 of (x) bit width of SIG6. In the next cycle, it outputs the lower (x) bit of the test data A of the SIG5-1 to a test object circuit as a test data A-2 of (x) bit width of SIG6. This invention can be applied to a semiconductor integrated circuit which executes test of circuit for high speed, using with actual frequency. COPYRIGHT: (C)2005,JPO&NCIPI