ELECTRODEPOSITION CHARACTERISTIC MEASURING DEVICE, EVALUATION METHOD AND MANAGEMENT METHOD

PROBLEM TO BE SOLVED: To provide a measuring device and a measuring method capable of measuring an electrodeposition paint characteristic simply in a short time, and contributing to management of the electrodeposition paint characteristic. SOLUTION: This electrodeposition characteristic measuring de...

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Bibliographische Detailangaben
Hauptverfasser:	NAKAOKA TOYOHITO, SHINDO KENICHI
Format:	Patent
Sprache:	eng
Schlagworte:	APPARATUS THEREFOR CHEMISTRY ELECTROFORMING ELECTROLYTIC OR ELECTROPHORETIC PROCESSES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS METALLURGY PHYSICS PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTIONOF COATINGS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a measuring device and a measuring method capable of measuring an electrodeposition paint characteristic simply in a short time, and contributing to management of the electrodeposition paint characteristic. SOLUTION: This electrodeposition characteristic measuring device is equipped with an impedance analyzer A having a quartz oscillator (a) and a constant-current power supply device B. This electrodeposition characteristic measuring device is equipped with the impedance analyzer A having the quartz oscillator (a) and a constant-voltage power supply device C. In the evaluation method of the electrodeposition paint characteristic, the electrodeposition characteristic measuring device is dipped into the electrodeposition paint, and the film thickness (μm) to an applied voltage V at the electrodeposition painting time of the electrodeposition paint is calculated from a resonance frequency and/or a resonance resistance value acquired from the quartz oscillator (a). COPYRIGHT: (C)2005,JPO&NCIPI