SEMICONDUCTOR STORAGE DEVICE

PROBLEM TO BE SOLVED: To provide a semiconductor storage device which has an ECC (Error Check and Correct) function and a defect-relieving function and reduces the number of redundancy cells. SOLUTION: The semiconductor storage device 1 stores a p-bit error correction signal for ECC in a redundancy...

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1. Verfasser: SUZUKI AZUMA
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a semiconductor storage device which has an ECC (Error Check and Correct) function and a defect-relieving function and reduces the number of redundancy cells. SOLUTION: The semiconductor storage device 1 stores a p-bit error correction signal for ECC in a redundancy cell group 4 and serves as a memory with the ECC function which corrects an error of n-bit data stored in a main cell group 2 in an ECC circuit 6, when the ECC circuit is turned on. The storage device 1 uses the redundancy cell group 4 as spare cells for relieving defective cells and serves as a defective cell relieving memory which relieves a maximum number p of defective cells among a number n of data bit cells storing n-bit data by means of a defective cell relieving part 7 in the main cell group 2, when the ECC circuit is turned off. COPYRIGHT: (C)2005,JPO&NCIPI