PSEUDO PATTERN DEPENDENT JITTER GENERATOR AND JITTER MEASUREMENT DEVICE EVALUATING APPARATUS

PROBLEM TO BE SOLVED: To enable correctly grasping measurement accuracy and linearity of a jitter measurement device for a pattern dependent jitter. SOLUTION: A pseudo pattern dependent jitter generator 21 generates a pulse signal P having a predetermined width and a predetermined amplitude synchron...

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1. Verfasser: NISHIOHARA MASANORI
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To enable correctly grasping measurement accuracy and linearity of a jitter measurement device for a pattern dependent jitter. SOLUTION: A pseudo pattern dependent jitter generator 21 generates a pulse signal P having a predetermined width and a predetermined amplitude synchronizing with a reference clock Cr at a predetermined interval, forms a data signal D synchronizing with a jitter clock Cj obtained by phase-modulating the reference clock Cr with the pulse signal P, and outputs this data signal D as a signal to which a pattern dependent jitter is given in pseudo to a jitter measurement deice 1 to be evaluated. A pattern dependent jitter measurement section 30 measures the pattern dependent jitter of the data signal D. Also, an evaluating section 40 performs processing for evaluating the jitter measurement device 1 on the basis of a result of measurement of the measurement device 1 for the data signal D and a result of measurement of the measurement device 30. COPYRIGHT: (C)2005,JPO&NCIPI