SCAN UNIT OF LOCATING SYSTEM

PROBLEM TO BE SOLVED: To provide a scan unit which enables size reduced configuration and flexible adjustment, its structural part is continuously stable after completion of adjustment, and which can also be fixed easily. SOLUTION: In this scan unit of locating system for photoelectric scanning of a...

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Bibliographische Detailangaben
Hauptverfasser:	FALKINGER BERNHARD, GSCHOSSMANN HORST, TONDORF SEBASTIAN
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a scan unit which enables size reduced configuration and flexible adjustment, its structural part is continuously stable after completion of adjustment, and which can also be fixed easily. SOLUTION: In this scan unit of locating system for photoelectric scanning of a scale (1), an electrode holder (5) is guided toward a scanning space A in the longitudinal direction within a notch (4) of a carrier (3), while being rotatably pivoted in all directions. After adjustment of the electrode holder (5) has been made, this holder is integrally fixed integrally to the carrier (3). COPYRIGHT: (C)2005,JPO&NCIPI